1. Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems,24-26 October 2001, San Francisco, California
Author: sponsored by IEEE Computer Society technical committee on fault- tolerant coputing; IEEE computer society test technology technical council
Library: Library of Niroo Research Institue (Tehran)
Subject: Very large scale integration Design and construction Congresses ، Integrated circuits,Fault tolerance Congresses ، Integrated circuits
Classification :
TK
7874
.
D415
2001
