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عنوان
An artificial intelligence approach to test generation

پدید آورنده
Singh, Narinder

موضوع
Integrated circuits - Very large scale integration - Testing - Data processing , Expert systems )Computer science( , Artificial intelligence

رده
TK
7874
.
S533

کتابخانه
Central Library of Amirkabir University of Technology

محل استقرار
استان: Tehran ـ شهر: Tehran

Central Library of Amirkabir University of Technology

تماس با کتابخانه : ۶۶۴۰۷۴۱۸(۰۲۱) – ۶۴۵۴۲۳۴۹(۰۲۱)

CE

TITLE AND STATEMENT OF RESPONSIBILITY

First Statement of Responsibility
Singh, Narinder
Title Proper
An artificial intelligence approach to test generation

.PUBLICATION, DISTRIBUTION, ETC

Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer Academic Publishers
Date of Publication, Distribution, etc.
1987

PHYSICAL DESCRIPTION

Specific Material Designation and Extent of Item
x, 193 p. : ill

SERIES

Series Title
The Kluwer international series in engineering and computer science, SECS 19

GENERAL NOTES

Text of Note
Includes bibliographical references )p. ]189[-193(

TOPICAL NAME USED AS SUBJECT

Entry Element
Integrated circuits - Very large scale integration - Testing - Data processing
Entry Element
Expert systems )Computer science(
Entry Element
Artificial intelligence

LIBRARY OF CONGRESS CLASSIFICATION

Class number
TK
Book number
7874
Classification Record Number
.
S533

PERSONAL NAME - PRIMARY RESPONSIBILITY

Relator Code
AU
Dates
1956-
Entry Element
by Narinder Singh

LOCATION AND CALL NUMBER

Shelving Form of Title, Author, Author/Title
English

Proposal/Bug Report

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