عنوان
پدید آورنده
موضوع
رده
TK7874.75 .V587 2006eb
TK7874
.
75
.
V587
2006eb
کتابخانه
محل استقرار
INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
0080474799
(Number (ISBN
9780080474793
Erroneous ISBN
0123705975
Erroneous ISBN
9780123705976
NATIONAL BIBLIOGRAPHY NUMBER
Number
b717549
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
VLSI test principles and architectures :
General Material Designation
[Book]
Other Title Information
design for testability /
First Statement of Responsibility
edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston :
Name of Publisher, Distributor, etc.
Elsevier Morgan Kaufmann Publishers,
Date of Publication, Distribution, etc.
©2006.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
1 online resource (xxx, 777 pages) :
Other Physical Details
illustrations
SERIES
Series Title
The Morgan Kaufmann series in systems on silicon
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index.
CONTENTS NOTE
Text of Note
Design for testability / Laung-Terng (L.-T.) Wang, Xiaoqing Wen, and Khader S. Abdel-Hafez -- Logic and fault simulation / Jiun-Lang Huang, James C.-M. Li, and Duncan M. (Hank) Walker -- Test generation / Michael S. Hsiao -- Logic built-in self-test / Laung-Terng (L.-T.) Wang -- Test compression / Xiaowei Li, Kuen-Jong Lee, and Nur A. Touba -- Logic diagnosis / Shi-Yu Huang -- Memory testing and built-in self-test / Cheng-Wen Wu -- Memory diagnosis and built-in self-repair / Cheng-Wen Wu -- Boundary scan and core-based testing / Kuen-Jong Lee -- Analog and mixed-signal testing / Chauchin Su -- Test technology trends in the nanometer age / Kwang-Ting (Tim) Cheng, Wen-Ben Jone, and Laung-Terng (L.-T.) Wang.
0
SUMMARY OR ABSTRACT
Text of Note
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
ACQUISITION INFORMATION NOTE
Source for Acquisition/Subscription Address
Elsevier Science & Technology
Stock Number
132281:132389
OTHER EDITION IN ANOTHER MEDIUM
Title
VLSI test principles and architectures.
International Standard Book Number
9780123705976
TOPICAL NAME USED AS SUBJECT
Integrated circuits-- Very large scale integration-- Design.
Integrated circuits-- Very large scale integration-- Testing.
Circuits intégrés à très grande échelle-- Conception et construction.
Circuits intégrés à très grande échelle-- Essais.
Circuitos integrados vlsi.
COMPUTERS-- Logic Design.
Integrated circuits-- Very large scale integration-- Design.
Integrated circuits-- Very large scale integration-- Design.
Integrated circuits-- Very large scale integration-- Testing.
Integrated circuits-- Very large scale integration-- Testing.
TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- Logic.
TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- VLSI & ULSI.
Testen
VLSI
(SUBJECT CATEGORY (Provisional
COM-- 036000
TEC-- 008030
TEC-- 008050
DEWEY DECIMAL CLASSIFICATION
Number
621
.
39/5
Edition
22
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK7874
.
75
Book number
.
V587
2006eb
OTHER CLASS NUMBERS
Class number
ZN
4030
Class number
ZN
4030
.
Class number
ZN
4950
Class number
ZN
4950
.
Class number
ZN
4952
Class number
ZN
4952
.
System Code
rvk
System Code
rvk
System Code
rvk
System Code
rvk
System Code
rvk
System Code
rvk
PERSONAL NAME - ALTERNATIVE RESPONSIBILITY
Wang, Laung-Terng
Wen, Xiaoqing
Wu, Cheng-Wen,EE Ph. D.
ORIGINATING SOURCE
Date of Transaction
20201208095225.0
Cataloguing Rules (Descriptive Conventions))
pn
ELECTRONIC LOCATION AND ACCESS
Electronic name
مطالعه متن کتاب [Book]
Y
