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عنوان
2000 IEEE International Workshop on Defect Based Testing, April 30, 2000, Montreal, Canada

پدید آورنده
sponsored by IEEE Computer Society Test Technology Technical Committee; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon

موضوع
Testing -- Congresses ، Metal oxide semiconductors, Complementary,Congresses ، Iddq testing,Defects -- Congresses ، Integrated circuits

رده
TK
7871
.
99
.
M44
2000

کتابخانه
Central Library and Information Center of Ferdowsi University of Mashhad

محل استقرار
استان: Khorasan Razavi ـ شهر: Mashhad

Central Library and Information Center of Ferdowsi University of Mashhad

تماس با کتابخانه : 05138806503

OTHER STANDARD IDENTIFIER

Standard Number
22935

TITLE AND STATEMENT OF RESPONSIBILITY

Title Proper
2000 IEEE International Workshop on Defect Based Testing, April 30, 2000, Montreal, Canada

.PUBLICATION, DISTRIBUTION, ETC

Place of Publication, Distribution, etc.
Washington
Name of Publisher, Distributor, etc.
IEEE Computer Society
Date of Publication, Distribution, etc.
c2000

PHYSICAL DESCRIPTION

Specific Material Designation and Extent of Item
ix, 82p.: ill

GENERAL NOTES

Text of Note
"The workshop has been renamed from 'Iddq Testing' to 'DBT" - P. vii
Text of Note
"IEEE Computer Society Order Number PR00637" - T.p. verso
Text of Note
"IEEE order plan catalog number PR00637" - T.p. verso
Text of Note
Online version also available to IEEE Xplore subscribers
Text of Note
Includes bibliographical references and index

NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY

Text of Note
sponsored by IEEE Computer Society Test Technology Technical Committee; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon

TOPICAL NAME USED AS SUBJECT

Entry Element
Testing -- Congresses ، Metal oxide semiconductors, Complementary
Entry Element
Congresses ، Iddq testing
Entry Element
Defects -- Congresses ، Integrated circuits

LIBRARY OF CONGRESS CLASSIFICATION

Class number
TK
7871
.
99
.
M44
2000

PERSONAL NAME - PRIMARY RESPONSIBILITY

Relator Code
AU

AU Malaiya, Yashwant K.
AU Sachdev, Manoj
AU Menon, Sankaran M.
TI

CORPORATE BODY NAME - SECONDARY RESPONSIBILITY

Entry Element
IEEE International Workshop on Defect Based Testing )2000: Montreal(

LOCATION AND CALL NUMBER

Call Number Suffix
CL

Proposal/Bug Report

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