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عنوان
An artificial intelligence approach to test generation

پدید آورنده
by Narinder Singh

موضوع
Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (computer science),Artificial intelligence

رده
TK
,
7874
,.
S533
,
1987

کتابخانه
Central Library and Document Center of Shahid Madani University of Azarbayjan

محل استقرار
استان: East Azarbaijan ـ شهر: Tabriz

Central Library and Document Center of Shahid Madani University of Azarbayjan

تماس با کتابخانه : 34327567-041

English Book

TITLE AND STATEMENT OF RESPONSIBILITY

Title Proper
An artificial intelligence approach to test generation
First Statement of Responsibility
by Narinder Singh

.PUBLICATION, DISTRIBUTION, ETC

Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer Academic
Date of Publication, Distribution, etc.
1987

PHYSICAL DESCRIPTION

Specific Material Designation and Extent of Item
x, 193 P.; 25c.m

INTERNAL BIBLIOGRAPHIES/INDEXES NOTE

Text of Note
Bibliography: P. 189

TOPICAL NAME USED AS SUBJECT

Entry Element
Integrated circuits - Very large scale integration - Testing - Data processing
Entry Element
Expert systems (computer science)
Entry Element
Artificial intelligence

LIBRARY OF CONGRESS CLASSIFICATION

Class number
TK
,
7874
,.
S533
,
1987

PERSONAL NAME - PRIMARY RESPONSIBILITY

Entry Element
Singh, Narinder 1956

PERSONAL NAME - SECONDARY RESPONSIBILITY

Entry Element
Title
Entry Element
Series

Proposal/Bug Report

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