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عنوان
An artificial intelligence approach to test generation
پدید آورنده
/ by Narinder Singh
موضوع
Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
رده
TK
7874
.
S533
1986
کتابخانه
Tehran University, technical faculty libraries 1
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
66498986
-
021
INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
0-89838-185-1
NATIONAL BIBLIOGRAPHY NUMBER
Country Code
IR
Number
28518
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
انگلیسی
COUNTRY OF PUBLICATION OR PRODUCTlON
Country of publication
IR
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
An artificial intelligence approach to test generation
General Material Designation
[Book]
First Statement of Responsibility
/ by Narinder Singh
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
: Academic Press
Date of Publication, Distribution, etc.
, 1987
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
x, 193 p.
Other Physical Details
: ill.
Dimensions
; 25 cm
SERIES
Series Title
The Kluwer international series in engineering and computer science, SECS 19
GENERAL NOTES
Text of Note
English
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes index
TOPICAL NAME USED AS SUBJECT
Integrated circuits - Very large scale integration - Testing - Data processing
Expert systems (Computer science)
Artificial intelligence
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
Book number
.
S533
1986
PERSONAL NAME - PRIMARY RESPONSIBILITY
Singh, Narinder, 1956-, author
ORIGINATING SOURCE
Country
ایران
Agency
University of Tehran. Library of Technical Camp 1
Old cataloging
p
BL
1
Y
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