TY  - BOOK
A1  - edited by R. Rajsuman and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology; in cooperation with the IEEE Solid-State Circuits Society
TI  - Records of the 1999 IEEE International Workshop on memory Technology, Design and Testing, August 9-10, 1999, San Jose, Calif., USA
PB  - کتابخانه پژوهشگاه دانشهای بنیادی
SN  - 101382973
UR  /book/101382973/Records-of-the-1999-IEEE-International-Workshop-on/
ER  -