عنوان

A parallel testing algorithm for pattern sensitive faults in random access memory

Number

TLpq230778141

.Language of Text, Soundtrack etc

انگلیسی

Title Proper

A parallel testing algorithm for pattern sensitive faults in random access memory

General Material Designation

[Thesis]

First Statement of Responsibility

S. Lu

Subsequent Statement of Responsibility

M. Ashtijou

Name of Publisher, Distributor, etc.

Texas A&M University - Kingsville

Date of Publication, Distribution, etc.

1994

Specific Material Designation and Extent of Item

154

Dissertation or thesis details and type of degree

M.S.

Body granting the degree

Texas A&M University - Kingsville

Text preceding or following the note

1994

Text of Note

A pattern sensitive fault recognition algorithm (PSFRA) is presented that not only detects and locates the neighborhood pattern sensitive faults (NPSF) but also it recognizes the types of the fault. A parallel testing structure for NPSF in Random Access Memory (RAM) has been developed in (1) to reduce overall test time and cost. It is designed for a broad class of pattern-sensitive faults and is significantly more efficient than previous approaches. The algorithm is modified to provide a fault type recognition capability that helps in differentiating between active, passive, and static NPSF for Type-1 and Type-2 neighborhood. The PSFRA needs 321 N write operations and 480 N read operations for Type-1 neighborhood, and it needs 129 N write operations and 192 N read operations for Type-2 neighborhood (N is the memory size). The recognition of fault is in expense of more test time and it is still more efficient than sequential algorithms.

Applied sciences

Computer science

Electrical engineering

M. Ashtijou

S. Lu

Electronic name

p

[Thesis]

276903

a

Y