عنوان
پدید آورنده
موضوع
رده
TK7874.75
TK7874
.
75
کتابخانه
محل استقرار
INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
9789811324932
(Number (ISBN
9789811324949
(Number (ISBN
9789811347849
(Number (ISBN
981132493X
(Number (ISBN
9811324948
(Number (ISBN
9811347840
Erroneous ISBN
9789811324925
Erroneous ISBN
9811324921
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Test generation of crosstalk delay faults in VLSI circuits /
General Material Designation
[Book]
First Statement of Responsibility
S. Jayanthy, M.C. Bhuvaneswari.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Singapore :
Name of Publisher, Distributor, etc.
Springer,
Date of Publication, Distribution, etc.
[2019].
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
1 online resource (xi, 156 pages) :
Other Physical Details
illustrations (some color)
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references.
CONTENTS NOTE
Text of Note
Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects -- Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults -- Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm -- Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm -- Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization -- Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model -- Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits.
0
SUMMARY OR ABSTRACT
Text of Note
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
ACQUISITION INFORMATION NOTE
Source for Acquisition/Subscription Address
Springer Nature
Stock Number
com.springer.onix.9789811324932
OTHER EDITION IN ANOTHER MEDIUM
International Standard Book Number
9789811324925
TOPICAL NAME USED AS SUBJECT
Crosstalk.
Integrated circuits-- Very large scale integration-- Testing.
Circuits and Systems.
Control Structures and Microprogramming.
Logic Design.
Performance and Reliability.
Algorithms & data structures.
Circuits & components.
Computer architecture & logic design.
Crosstalk.
Integrated circuits-- Very large scale integration-- Testing.
Systems analysis & design.
TECHNOLOGY & ENGINEERING / Mechanical
(SUBJECT CATEGORY (Provisional
TEC-- 009070
TJFC
TJFC
DEWEY DECIMAL CLASSIFICATION
Number
621
.
39/5
Edition
23
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK7874
.
75
PERSONAL NAME - PRIMARY RESPONSIBILITY
Jayanthy, S.
PERSONAL NAME - ALTERNATIVE RESPONSIBILITY
Bhuvaneswari, M. C.
ORIGINATING SOURCE
Date of Transaction
20200823235446.0
Cataloguing Rules (Descriptive Conventions))
pn
ELECTRONIC LOCATION AND ACCESS
Electronic name
مطالعه متن کتاب [Book]
Y
